|  Chul Lee, an Applications Technology Leader at BASF, has been involved with plastics applications and developmental activities for the past three decades. Working out of BASF Corporation’s Wyandotte, Michigan facility, Chul has a wealth of experience in various areas of plastics research, including service life prediction research for the plastics pipeline industry, and application of CAE technology for plastics product development. Chul’s current endeavors in the field are focused on the development of plastics joining technology, such as vibration welding, laserwelding and mechanical fastening.
During the last 10 years, Chul has been actively involved in applications development work pertaining to the automotive and industrial market segments. Concentrating on application developments for the automotive powertrain market, including plastic air intake manifold developments and oil supply systems, Chul has coordinated BASF Global Research on Joining Technologies, such as vibration welding, laserwelding, snap fits, mechanical fastening and adhesive joining. Results of Mr. Lee’s research is often disseminated both internally and in the public domain by virtue of participation in seminars and publication distribution at major technical conferences.
Chul, a Ph.D. graduate from the University of Michigan’s Mechanical Engineering department, has published many papers on various technical development topics. His academic specialization in the field of Fracture Behavior of Plastics Materials enables his astute research and subsequent publication of a multiplicity of topics, ranging from Snap Fit Design, Ribbing Design Optimization, Vibration welding optimization, and NVH (Noise Vibration and Harshness) experiments and simulations of air intake manifolds, and Laserwelding. Chul is also responsible for several patents, such as a patent on NVH, multiple patents on vibration welding, and currently has a patent pending on stone impact resistant ribbing design.
Chul Lee, Applications Technology Leader, BASF
chul.lee@basf.com
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